From a practical point of view, this preparation is rather demanding for (complex) heterogeneous specimens. The Rietveld refinement method (McCusker et al., 1999 ▸) is generally applied to conduct quantitative analysis of XRD patterns, but it requires the diffraction profiles for all possible phase constituents to be collected appropriately during the preparation stage, so that the individual components can be adequately identified afterwards. Although XRD has been primarily emphasized as an efficient tool for qualitative analyses, it is often used to perform quantitative measurements of the phase concentrations within a material. X-ray diffraction (XRD) is a popular non-destructive qualitative and quantitative technique aimed at characterizing crystal lattice parameters (Drickamer et al., 1967 ▸), local strain (Gailhanou et al., 2007 ▸), microstructure evolution (Oliveira et al., 2022 ▸) or phase constituent proportions (Peng et al., 2005 ▸) from analysed specimens ( e.g.
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